Contact person: Sašo Šturm, e-mail: saso.sturm@ijs.si
Contact person: Sašo Šturm, e-mail: saso.sturm@ijs.si
The Advanced Electron Microscopy Group develops and implements cutting-edge electron microscopy techniques for materials characterisation.
Our approach creates a seamless integration between material synthesis, atomic-scale structural and chemical characterisation, and the resulting physical properties, supported by atomic-level modelling based on Density-Functional theory (DFT). We employ diverse Electron Microscopy (EM) techniques for advanced nanomaterial characterisation, focusing on extracting detailed information from material’s interfaces. Recently, we have focused on 4D Scanning Transmission Electron Microscopy (STEM/4D-STEM) and electron ptychography to reconstruct the electron exit wave, coupled with computational microscopy for high-data, high-speed processing and smart automatisation of microscopy procedures. In experimental microscopy, we employ in-situ TEM techniques to study materials in their natural environments and under dynamic conditions, in-opreando. Additionally, we continuously innovate specimen preparation routines using focused ion-beam technology to support advanced TEM analysis.